Measuring and Mapping Surface Textures and Surface Finishes in 3D with SWLI
A Scanning White Light Interferometer (SWLI) is a device for measuring the physical geometrical (3D) characteristics of an object using broadband white light. Fourier analysis (and other methods) are used to convert interference intensity data (fringes) to the spatial frequency domain, allowing production of an extremely accurate surface map. Continue reading Measuring and Mapping Surface Textures and Surface Finishes in 3D with SWLI
You must be logged in to post a comment.